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Proven Power Cycling Reliability of SmartSiC(TM) Substrate for Power Devices

Eric Guiot, Gonzalo Picun,Frederic Allibert,Juergen Leib,Tom Becker,Walter Schwarzenbach,Alexis Drouin,Jean-Marc Bethoux,Julie Widiez,Severin Rouchier,Tobias Erlbacher

PCIM Europe 2022; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management（2022）

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