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SEE Testing on commercial power MOSFETs

Pablo Fernández-Martínez,Athina Papadopoulou,Salvatore Danzeca,Gilles Foucard,Rubén García Alía,Maria Kastriotou,Carlo Cazzaniga, Giorgos Tsiligiannis,Remi Gaillard

2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)（2020）

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Abstract
This work compiles the outcome of several irradiation test campaigns, carried out with the aim of studying the susceptibility to hard Single Event Effects (SEE) of various commercial power MOSFET references. Proton, neutron and heavy ion irradiation were performed on the same set of MOSFET references, allowing for a comparison of their respective Single Event Burnout (SEB) and Single Event Gate Rupture (SEGR) sensitiveness under different energy and particle irradiation conditions.
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Key words
irradiation test campaigns,susceptibility,hard Single Event Effects,commercial power MOSFET references,heavy ion irradiation,respective Single Event Burnout,Single Event Gate Rupture sensitiveness,particle irradiation conditions
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