Neutron and Proton Characterization of Microsemi 28 nm PolarFire SONOS-Based FPGA

Nadia Rezzak,Jih-Jong Wang,Stephen Varela,Gregory Bakker,Ang Nan Gu

2018 IEEE Radiation Effects Data Workshop (REDW)（2018）

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摘要

The Single-Event response of Microsemi 28 nm PolarFire FPGA is characterized using neutron and 64 MeV proton sources. Single-Event Latchup (SEL), Single Event Upset (SEU) and Single Event Functional Interrupt (SEFI) results are presented.

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关键词

Single-Event Latchup,Single Event Upset,proton characterization,Single-Event response,proton sources,single event functional interrupt,microsemiPolarFire SONOS-based FPGA,neutron characterization,SEL,SEU,SEFI,size 28.0 nm,electron volt energy 64.0 MeV

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