Validation of Field-Plate Structures in Transistors on Rad-hardened

Poly and metal field-plate structures were designed in lateral-PNP bipolar junction transistors which fabricated on standard linear bipolar technology for validating their TID hardened effectiveness. ⁶⁰ Co γ irradiation experiment was executed on these samples and experimental results were compared. Results showed that metal field-plate was better than poly field-plate.