The Experimental Study on SEU Hardened Effect of Flash FPGA for Space Application
2018 International Conference on Radiation Effects of Electronic Devices (ICREED)（2018）
Abstract
SEU hardened design is done for BRAM and register of a Flash FPGA. Test is performed to verify the measures. It shows the cross section reduces 2 orders and 75%, respectively. SEU rate is calculated for different orbits. It reduces 4-5 orders for hardened BRAM and 2-3 orders for hardened register.
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Key words
Calculation Flash FPGA Hardened SEU rate
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