Chip-Level High-Frequency EMC Strategies and Measurement Techniques

Yin-Cheng Chang,Ping-Yi Wang,Ta-Yeh Lin, Chao-Ping Hsieh,Da-Chiang Chang,Shawn S. H. Hsu

2022 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)（2022）

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摘要

This paper presents different electromagnetic compatibility (EMC) strategies for achieving low EM emission and high immunity. The proposed designs and measurement techniques for improving and evaluating the chip level EM interference (EMI) and EM susceptibility (EMS) are included to provide high-frequency EMC solutions. This paper also gives a comprehensive overview for the researchers to continue working on the EMC-related topics and issues at the chip level at high frequencies.

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关键词

electromagnetic interference (EMI),electromagnetic susceptibility (EMS),IC-electromagnetic compatibility (IC-EMC),measurement,on-chip

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