Nonlinear Loss and Damage Threshold in Silicon Photonic Waveguides: Modelling and Experimental Verification
Conference on Lasers and Electro-Optics（2022）
摘要
Nonlinear losses of integrated waveguides are crucial for many applications. We develop and experimentally verify a quantitative model for two-photon absorption (TPA), subsequent free-carrier absorption (FCA), and damage thresholds of silicon photonic waveguides under pulsed and continuous-wave (CW) operation.
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关键词
subsequent free-carrier absorption,damage thresholds,silicon photonic waveguides,experimental verification,nonlinear losses,integrated waveguides,quantitative model
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