Imaging of Defects in Additively Manufactured Alloys Using Betatron X-Rays
2022 IEEE International Conference on Plasma Science (ICOPS)（2022）
Key words
trapped relativistic electrons,laser wakefield acceleration,betatron sources,broadband keV X-rays,source sizes,few-femtosecond pulse durations,high-resolution phase contrast,X-ray imaging,spatial resolution,betatron X-rays,high-resolution imaging,micrometer-scale defects,aluminium-silicon alloys,X-ray source spectrum,source size,betatron emission length,Advanced Laser Light Source,high-throughput 3D tomography,betatron radiation,synchrotron-like X-ray emission
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