Benefits of a Full Field of View in Atom Probe Tomography

Journal Article Benefits of a Full Field of View in Atom Probe Tomography Get access David A Reinhard, David A Reinhard CAMECA Instruments Inc., Madison, WI, USA Corresponding author: David.Reinhard@AMETEK.com Search for other works by this author on: Oxford Academic Google Scholar Katherine P Rice, Katherine P Rice CAMECA Instruments Inc., Madison, WI, USA Search for other works by this author on: Oxford Academic Google Scholar Robert M Ulfig, Robert M Ulfig CAMECA Instruments Inc., Madison, WI, USA Search for other works by this author on: Oxford Academic Google Scholar Isabelle Martin, Isabelle Martin CAMECA Instruments Inc., Madison, WI, USA Search for other works by this author on: Oxford Academic Google Scholar Brian P Geiser, Brian P Geiser CAMECA Instruments Inc., Madison, WI, USA Search for other works by this author on: Oxford Academic Google Scholar David J Larson David J Larson CAMECA Instruments Inc., Madison, WI, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 28, Issue S1, 1 August 2022, Pages 706–708, https://doi.org/10.1017/S1431927622003294 Published: 01 August 2022