Sparsity and Noise Effects on the Reconstruction of Subsampled Scanning Transmission Electron Microscopy Data

Microscopy and Microanalysis（2022）

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摘要

Journal Article Sparsity and Noise Effects on the Reconstruction of Subsampled Scanning Transmission Electron Microscopy Data Get access Eduardo Ortega, Eduardo Ortega INM - Leibniz Institute for New Materials, Saarbrücken, Germany Search for other works by this author on: Oxford Academic Google Scholar Niels de Jonge Niels de Jonge INM - Leibniz Institute for New Materials, Saarbrücken, GermanyDepartment of Physics, Saarland University, Saarbrücken, Germany Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 28, Issue S1, 1 August 2022, Pages 2136–2137, https://doi.org/10.1017/S1431927622008273 Published: 01 August 2022

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关键词

Scanning Electron Microscopy,Environmental Scanning Electron Microscopy,Neural Circuit Reconstruction,Ambient Pressure Photoelectron Spectroscopy,Single-Particle Analysis

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