Advancements in UltraFast Electron Microscopy

Journal Article Advancements in UltraFast Electron Microscopy Get access Darrin Leonhardt, Darrin Leonhardt Euclid Techlabs, LLC, Beltsville, MD, USA Corresponding author: d.leonhardt@euclidtechlabs.com Search for other works by this author on: Oxford Academic Google Scholar Eric Montgomery, Eric Montgomery Euclid Techlabs, LLC, Beltsville, MD, USA Search for other works by this author on: Oxford Academic Google Scholar Chunguang Jing, Chunguang Jing Euclid Techlabs, LLC, Bolingbrook, IL, USA Search for other works by this author on: Oxford Academic Google Scholar Bart Wyderski, Bart Wyderski Euclid Techlabs, LLC, Bolingbrook, IL, USA Search for other works by this author on: Oxford Academic Google Scholar Yubin Zhao, Yubin Zhao Euclid Techlabs, LLC, Bolingbrook, IL, USA Search for other works by this author on: Oxford Academic Google Scholar Spencer Reisbick, Spencer Reisbick Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, NY, USA Search for other works by this author on: Oxford Academic Google Scholar Yimei Zhu, Yimei Zhu Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, NY, USA Search for other works by this author on: Oxford Academic Google Scholar June Lau, June Lau Materials Science and Engineering Division, National Institute of Standards and Technology, Gaithersburg, MD, USA Search for other works by this author on: Oxford Academic Google Scholar John Roehling John Roehling Materials Science Division, Lawrence Livermore National Laboratory, Livermore, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 28, Issue S1, 1 August 2022, Pages 1802–1803, https://doi.org/10.1017/S1431927622007127 Published: 01 August 2022