100,000 Diffraction Patterns Per Second with Live Processing for 4D-STEM

Journal Article 100,000 Diffraction Patterns per Second with Live Processing for 4D-STEM Get access Benjamin Plotkin-Swing, Benjamin Plotkin-Swing Nion Co. R&D, Kirkland, WA, USA Corresponding author: plotkin-swing@nion.com Search for other works by this author on: Oxford Academic Google Scholar Benedikt Haas, Benedikt Haas Department of Physics & IRIS Adlershof, Humboldt-Universität zu Berlin, Berlin, Germany Search for other works by this author on: Oxford Academic Google Scholar Andreas Mittelberger, Andreas Mittelberger Nion Co. R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar Niklas Dellby, Niklas Dellby Nion Co. R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar Michael Hotz, Michael Hotz Nion Co. R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar Petr Hrncirik, Petr Hrncirik Nion Co. R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar Chris Meyer, Chris Meyer Department of Physics & IRIS Adlershof, Humboldt-Universität zu Berlin, Berlin, Germany Search for other works by this author on: Oxford Academic Google Scholar Pietro Zambon, Pietro Zambon DECTRIS Ltd., Baden-Daettwil, Switzerland Search for other works by this author on: Oxford Academic Google Scholar Christoph Hoermann, Christoph Hoermann DECTRIS Ltd., Baden-Daettwil, Switzerland Search for other works by this author on: Oxford Academic Google Scholar Matthias Meffert, Matthias Meffert DECTRIS Ltd., Baden-Daettwil, Switzerland Search for other works by this author on: Oxford Academic Google Scholar ... Show more Darya Bachevskaya, Darya Bachevskaya DECTRIS Ltd., Baden-Daettwil, Switzerland Search for other works by this author on: Oxford Academic Google Scholar Luca Piazza, Luca Piazza DECTRIS Ltd., Baden-Daettwil, Switzerland Search for other works by this author on: Oxford Academic Google Scholar Ondrej L Krivanek, Ondrej L Krivanek Nion Co. R&D, Kirkland, WA, USADepartment of Physics, Arizona State University, Tempe AZ, USA Search for other works by this author on: Oxford Academic Google Scholar Tracy Clark Lovejoy Tracy Clark Lovejoy Nion Co. R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 28, Issue S1, 1 August 2022, Pages 422–424, https://doi.org/10.1017/S1431927622002392 Published: 01 August 2022