Improving Data from Electron Backscatter Diffraction Experiments using Pattern Matching Techniques

Journal Article Improving Data from Electron Backscatter Diffraction Experiments using Pattern Matching Techniques Get access Pat Trimby, Pat Trimby Oxford Instruments Nanoanalysis, High Wycombe, HP12 3SE, UK Corresponding author: pat.trimby@oxinst.com Search for other works by this author on: Oxford Academic Google Scholar Kim Larsen, Kim Larsen Oxford Instruments Nanoanalysis, High Wycombe, HP12 3SE, UK Search for other works by this author on: Oxford Academic Google Scholar Michael Hjelmstad, Michael Hjelmstad Oxford Instruments America, Inc., Pleasanton, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Aimo Winkelmann, Aimo Winkelmann ST Development GmbH, Paderborn, Germany Search for other works by this author on: Oxford Academic Google Scholar Klaus Mehnert Klaus Mehnert ST Development GmbH, Paderborn, Germany Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 28, Issue S1, 1 August 2022, Pages 3182–3183, https://doi.org/10.1017/S1431927622011813 Published: 01 August 2022