High Curvature Stripe Profile Extraction Algorithm of Line Structured Light Measuring System

In the line structured light measuring system, the accuracy of the process of laser stripe directly affects the measurement results. Therefore, the extraction algorithm for the laser stripe, especially the surface with high reflection and high curvature, is very important. The imaging principle of line structured light, the light intensity distribution law of laser stripe and the extraction algorithm have been studied, and a stripe profile extraction method based on real light intensity distribution has been proposed. In this algorithm, fast region of interest extraction, stripe width estimation, and adaptive filtering on the striped image are performed. Then the energy center of the stripe at the sub-pixel level is extracted. Finally, the low-quality center points are eliminated, and the context information is used to recover the missing central points. Simulated images generated based on the imaging principle of line structured light and real experimental images were used to evaluate the accuracy and repeatability of the proposed method. The results show that the method behaves excellently at the edges of high-curvature stripes; the maximum error is only 1.6 pixels, which is 1/10 of the classic Steger algorithm; the experiment repeatability is only 8.8 µm, which is 2.7 times that of the Steger method. Therefore, the proposed method improves the accuracy of object contour extraction, and it is especially suitable for contour detection of objects with high curvature.