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Circuit Design Flow dedicated to 3D vertical nanowire FET

2022 IEEE Latin American Electron Devices Conference (LAEDC)(2022)

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Abstract
To continue transistor downscaling beyond lateral 7nm devices, gate-all-around (GAA) junction-less vertical nanowire field effect transistors (VNWFET) represent a promising option. This invited paper presents the circuit design flow based on a vertical junctionless transistor technology. On the basis of state-of-the-art junctionless nanowire transistors (JLNT), DC characterization, compact modelling, EM simulation and parameter extraction are described in details. Using this circuit design flow, a set of innovative 3D circuit architectures are explored.
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Key words
Compact modelling,DC characterization,parasitics extraction,EM simulation,VNWFET,3D logic circuit simulation
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