A new normalized direct conductance method for observation of Poole-Frenkel current

•A graphical method to extract the parameters of the Poole-Frenkel current model is presented.•It accounts for the general case in which there is a voltage drop across a parasitic resistance.•It is tested with measurements of gate leakage current of a MOSFETs and with TCAD simulations.•The dominant conduction mechanism is Poole-Frenkel for the middle gate voltage region while Hot Electron Injection dominates the low- and high-voltage regions.