Neutron Radiation Testing of Fault Tolerant RISC-V Soft Processor on Xilinx SRAM-based FPGAs
2019 IEEE SPACE COMPUTING CONFERENCE (SCC)（2019）
关键词
RISC-V,Fault tolerance,redundancy,Triple Modular Redundancy (TMR),Single Event Upset (SEU),fault injection,radiation testing,FPGA,soft processor
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