Innovation Practices Track: Silicon Telemetry for Dependability

Fei Su, Stephen Crosher,Andrea Matteucci, Yuwen Zou

2022 IEEE 40th VLSI Test Symposium (VTS)(2022)

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摘要
Throughout the life cycle of silicon-based system deployment, there may be a service failure induced by external or internal effects (e.g., silicon failure). Dependability of a system is a term to define the ability that the system can avoid such service failure beyond an acceptance level. There is a broad spectrum of attributes of dependability, including reliability, maintainability and safety. Silicon telemetry is a key technique to gain insights of silicon and system in field, and it opens a door to a promising solution space for dependability improvement.
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关键词
silicon telemetry,dependability improvement,service failure,silicon failure,acceptance level,silicon-based system deployment life cycle,reliability,maintainability,safety,Si
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