A 14 × 14 electronically reconfigurable reflectarray using 1-bit reflective element

In this paper, a 14 ×14 electronically reconfigurable reflectarray for beam scanning is presented. The proposed 1-bit reflective element, which is used to construct the reflectarray, is based on PIN diodes and able to generate two reflective states with a 180° reflective phase difference and the reflection amplitudes of > -1 dB. Such two states can be switched by controlling the forward and reverse biasing of the diode. Simulated results show that scanning beams from -30° to +60° are achieved in the horizontal plane the feed located, with a peak gain of 20 dBi.