Search
ChatPaper
AI Writing
analysis
Analysis
编组
Open Data
more
More
RankingsMust ReadingJournal&ConferenceAI TRAI HistoryMaster Reading TreeXiaomai's Star TalentsTrajectoryTalentNDI TrackerOpenAI sign Language
VIPCreated with Sketch.

On the Dependability Lifecycle of Electrical/Electronic Product Development: The Dual-Cone V-Model

Bernhard Bauer, Mouadh Ayache,Saleh Mulhem, Meirav Nitzan,Jyotika Athavale,Rainer Buchty,Mladen Berekovic

Computer（2022）

Cited 1|Views2
No score
Abstract
How to understand the dependability concerning electrical/electronic (E/E) product development? We introduce an essential answer that can be perceived as the first step toward a novel approach for dependable E/E product development, called the dual-cone V-model.
More
Translated text
Key words
dependability lifecycle,dual-cone V-model,electrical-electronic product development
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined