Phase-shifting projected fringe profilometry by binary-encoded projections
Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XVI（2022）
Abstract
A binary encoding algorithm is presented for phase-shifting projected fringe profilometry. It does not require additional projections to identify fringe orders. The pattern used for phase extraction can be used for phase unwrapping directly. Fringes can be discerned even though the surface color or reflectivity varies with positions.
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Key words
phase unwrapping, fringe analysis, fringe projection, phase-shifting, optical inspection
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