De-embedding a Low-Cost Partial-Data Electromagnetic Imaging System

A method for de-embedding the data acquisition electronics of a low-cost Electromagnetic Imaging system applied to grain storage bins is presented. Unlike standard de-embedding schemes, the proposed approach requires only S 11 and S 21 data; the remaining S-parameters are estimated. De-embedding results for a commercial imaging system are consistent compared to traditional techniques using complete 2-port measurements of all components. This new approach suggests that imaging hardware costs can be reduced, which increases their commercial appeal.