Bayesian Semiparametric Regression Analysis of Multivariate Panel Count Data

Panel count data often occur in a long-term recurrent event study, where the exact occurrence time of the recurrent events is unknown, but only the occurrence count between any two adjacent observation time points is recorded. Most traditional methods only handle panel count data for a single type of event. In this paper, we propose a Bayesian semiparameteric approach to analyze panel count data for multiple types of events. For each type of recurrent event, the proportional mean model is adopted to model the mean count of the event, where its baseline mean function is approximated by monotone I-splines. The correlation between multiple types of events is modeled by common frailty terms and scale parameters. Unlike many frequentist estimating equation methods, our approach is based on the observed likelihood and makes no assumption on the relationship between the recurrent process and the observation process. Under the Poisson counting process assumption, we develop an efficient Gibbs sampler based on novel data augmentation for the Markov chain Monte Carlo sampling. Simulation studies show good estimation performance of the baseline mean functions and the regression coefficients; meanwhile, the importance of including the scale parameter to flexibly accommodate the correlation between events is also demonstrated. Finally, a skin cancer data example is fully analyzed to illustrate the proposed methods.