A reliability demonstration test plan derivation method based on subsystem test data
Computers & Industrial Engineering(2022)
摘要
•Subsystem test data are applied, to derive system fixed-duration test plans.•The method derives RDT plans with satisfactory risks, even with short test time.•The method enables find the best test plan regardless of the discrimination ratio.
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关键词
Reliability demonstration test,Test plan,Producer’s risk,Consumer’s risk,Subsystem test data
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