A reliability demonstration test plan derivation method based on subsystem test data

Computers & Industrial Engineering(2022)

引用 2|浏览9
暂无评分
摘要
•Subsystem test data are applied, to derive system fixed-duration test plans.•The method derives RDT plans with satisfactory risks, even with short test time.•The method enables find the best test plan regardless of the discrimination ratio.
更多
查看译文
关键词
Reliability demonstration test,Test plan,Producer’s risk,Consumer’s risk,Subsystem test data
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要