Normal-Incidence Infrared Silicon Photodetectors Based on Surface-State Absorption and Their Applications

Conference on Lasers and Electro-Optics(2022)

引用 0|浏览2
暂无评分
摘要
We fabricated and tested a normal-incidence infrared silicon photodetector based on surface-state absorption for free-space optical applications. It featured -46-dBm sensitivity and near transparency at 1560-nm wavelength as well as broad spectral photoresponse.
更多
查看译文
关键词
free-space optical applications,normal-incidence infrared silicon photodetector,surface-state absorption
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要