Dimensionality and bonding characters of Cu _2 Si self-assembled on Si(111)
Journal of the Korean Physical Society(2022)
Abstract
The electron band structure of single-layer Cu _2 Si self-assembled on Si(111) has been investigated using angle-resolved photoemission spectroscopy. Cu _2 Si is a two-dimensional (2D) Dirac nodal-line semimetal that is protected by the in-plane mirror reflection symmetry. Indeed, the electron band structure of Cu _2 Si shows non-dispersive states as a function of photon energy, whereas the electron band structure from the substrate shows strong photon energy dependence, supporting the 2D nature of Cu _2 Si. Polarization dependence shows that the spectral intensity of the electron band structure of Cu _2 Si is strongly but not completely suppressed when measured using photons with in-plane polarization. These findings indicate that Cu _2 Si is deformed along the out-of-plane direction, so that the out-of-plane mirror symmetry becomes important in the topological properties of Cu _2 Si when it is placed on an Si(111) substrate.
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Key words
Dirac nodal-line semimetal,Cu _2 Si,Si substrate,Bonding character,ARPES
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