The potential of microcalorimeter X-ray spectrometers for measurement of relative fluorescence-line intensities

We have previously used an array of cryogenic microcalorimeters with 4 eV energy resolution to measure emission-line profiles and energies of the characteristic L-shell X rays of four elements of the lanthanide series: praseodymium, neodymium, terbium, and holmium. We consider the power of the same data set for the estimation of the lines’ relative intensities. Intensities must be corrected for detector efficiency and self-absorption, and we estimate uncertainties on the corrections. These data represent one of the first uses of cryogenic energy-dispersive sensors to estimate the relative intensities of X-ray fluorescence lines. They show that a future measurement of thin-film samples with microcalorimeter detectors could achieve systematic uncertainties below 1% on relative line intensities over a broad energy range.