Reliability Analysis of a Spiking Neural Network Hardware Accelerator

Theofilos Spyrou,Sarah A. El-Sayed,Engin Afacan,Luis A. Camunas-Mesa,Bernabe Linares-Barranco,Haralampos-G Stratigopoulos

2022 Design, Automation &amp Test in Europe Conference &amp Exhibition (DATE)（2022）

Cited 20|Views54

Key words

fault injection experiments,inherently fault-tolerant,reliability analysis,neural network models,hardware-level faults,process-induced variations,fault scenarios,cost-effective fault-tolerance schemes,spiking neural network hardware accelerator,environmental factors,resilience characteristics,VHDL,FPGA

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