Discrete switching in the ion sliced lithium niobate thin films with thick dielectric layer

Domain growth and shape evolution during local switching under the action of biased conductive tip of scanning probe microscope were studied in Z + cut lithium niobate on insulator (LNOI) with 1 mu m-thick SiO2 layer between LN film and grounded electrode. Piezoresponse force microscopy and confocal Raman microscopy were used for domain imaging. The domain shape evolution during switching was qualitatively reconstructed. The crucial role of discrete switching on the kinetics of domain growth was revealed. The stability of the switched domains was confirmed. The obtained knowledge will be used for creation of the periodical domain structures by local switching.