Magnetron-sputtered and Thermal-Evaporated Low-Loss Sb-Se Phase-Change Films in Non-Volatile Integrated Photonics

Chalcogenide phase change materials (PCMs), featuring a large contrast in optical properties between their non-volatile amorphous and crystalline states, have triggered a surge of interest for their applications in ultra-compact photonic integrated circuits with long-term near-zero power consumption. Over the past decade, however, PCM-integrated photonic devices and networks suffered from the huge optical loss of various commonly-used PCMs themselves. In this paper, we focused on the deposition, characterization, and monolithic integration of an emerging low-loss phase change material, Sb 2 Se 3 on a silicon photonic platform. The refractive index contrast between the amorphous and crystalline phase of the evaporated Sb-Se thin film was optimized up to 0.823 while the extinction coefficient remains less than 10 −5 measured by ellipsometry. When integrated on a silicon waveguide, the propagation loss introduced by the amorphous thin film is negligibly low. After crystallization, the propagation loss of a magnetron-sputtered Sb-Se patch-covered silicon waveguide is as low as 0.019 dB/µm, while its thermal-evaporated counterpart is below 0.036 dB/µm.