Investigation and Simulation of SEL Cross Sections at Different Temperatures

E. V. Mrozovskaya, P. A. Chubunov, S. Iakovlev,G. I. Zebrev

IEEE Transactions on Nuclear Science（2022）

引用 0|浏览6

暂无评分

摘要

The single-event latchup (SEL) cross sections as functions of linear energy transfer (LET) in different CMOS circuits were experimentally investigated at different temperatures. A simplified simulation method for the SEL cross section temperature dependence is proposed and validated.

查看译文

关键词

Cross section,simulation,single-event latchup (SEL),temperature dependence

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要