A Soft-Error Hardened by Design Microprocessor Implemented on Bulk 12-Nm FinFET CMOS
IEEE Transactions on Nuclear Science（2022）
关键词
Radio frequency,Registers,Microprocessors,Software,Pipelines,FinFETs,Radiation hardening (electronics),FinFET,modular redundancy,radiation hardening by design (RHBD),soft errors (SEs)
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