X-ray Diffraction Analysis of the Structure In0.53Ga0.47As Films Grown on (100) and (111)A GaAs Substrates with a Metamorphic BufferFolomeshkin M. S.,Volkovsky Yu. A.,Prosekov P. A.,Galiev G. B.,Klimov E. A.,Klochkov A. N.,Pushkarev S. S.,Seregin A. Yu.,Pisarevsky Yu. V.,Blagov A. E.,Kovalchuk M. V.Crystallography Reports（2022）引用 2|浏览19AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
