High-Endurance Ferroelectric (La, Y) and (La, Gd) Co-Doped Hafnium Zirconate Grown by Atomic Layer Deposition
ACS APPLIED ELECTRONIC MATERIALS(2022)
摘要
Thin films based on stoichiometric hafnium zirconate doped and co-doped with La, Gd, and/or Y have been grown by atomic layer deposition on TiN electrodes. The resulting TiN-ferroelectric-TiN capacitors have shown high endurance up to 1 x 10(11) switching cycles. The simultaneous use of two dopants (Y, La) or (Gd, La) in hafnium zirconate increases the amount of orthorhombic and tetragonal phases. Fatigue-free capacitors with remnant polarization >= 15 mu C/cm(2) at 1 x 10(11) endurance cycles have been obtained for dopants having an atomic fraction of about 1.2-1.8% and showing great promise as active materials for emerging memory applications.
更多查看译文
关键词
ferroelectrics, hafnium zirconate, doping, lanthanum, remnant polarization, endurance, coercive field
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要