Modeling of SPAD avalanche breakdown probability and jitter tail with field lines

Solid-State Electronics(2022)

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摘要
•It is critical to be able to test SPAD design improvements without having to wait for silicon production, which necessitates predictive modeling.•A new methodology to accurately simulate the Photon Detection Efficiency and the Jitter tail of SPAD devices is presented.•This method first relies on the use of the electric field lines to mimic the carriers’ trajectories.•The results obtained numerically are compared with an extensive series of measurements and show a good agreement on a wide variety of device designs.
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关键词
Avalanche breakdown probability,Breakdown voltage,Jitter,Photon detection efficiency (PDE),Single-photon avalanche diode (SPAD),Technology computer-aided design (TCAD)
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