The Os substitution into Fe sites in LuFeO3 multiferroic and its effects on the electrical and dielectric features

Solid-state technique was utilized to obtain the LuFeO3 (LFO) and LuFe1−xOsxO3 (LFOO) compounds having x = 0.05 and 0.10. The orthorhombic structure and the presence of secondary phases in the studied samples have been unveiled by X-ray diffractometer (XRD) investigations. The scanning electron microscope (SEM) examinations have unveiled that not only the particle sizes enlarge with Os substitution but also particle agglomeration takes place. The X-ray photoelectron spectroscopy (XPS) investigations have exposed the oxidations of Fe as 2 + and 3 + for the LFO sample, 3 + for 5 mol% Os substituted specimen and mix of 2 + and 3 + for 10 mol% Os doped sample. In addition, it was shown that Os has 4 + oxidation state in the doped samples. Dielectrical and electrical conductivity studies of the obtained ceramics conducted between − 100 °C (173 K) up to 100 °C (373 K) with 20 °C temperature pace have shown that the undoped sample has much higher values than the Os doped samples. Such differences have been ascribed to the absence of Fe2+ ions and lattice distortions in the Os doped samples. In addition, it was realized that different conduction models need to be adapted to comprehend the conduction mechanism in the examined specimens.