Determining the extrinsic parameters of a network of Large-Volume Metrology sensors of different types

Large-Volume Metrology (LVM) instruments – such as laser trackers, photogrammetric systems, rotary-laser automatic theodolites, etc. – generally include several sensors, which measure the distances and/or angles subtended by some targets. This measurements, combined with the spatial position/orientation of sensors (i.e., the so-called extrinsic parameters), can be used to locate targets in the measurement volume. Extrinsic parameters of sensors are generally determined through dedicated sensor calibration methods, which are based on repeated measurements of specific artefacts.