Raman Spectroscopy of V4O7 Films

A thin film of vanadium oxide Magneli phase V4O7 was produced using cathodic arc sputtering. X-ray diffraction, Rutherford backscattering spectrometry and Raman investigations confirmed the formation of this phase. The Raman spectrum of V4O7 differs considerably from the spectrum of another Magneli oxide, V3O5, showing that Raman spectroscopy is an excellent tool for distinguishing between these two phases. Temperature-dependent Raman measurements revealed a significant change of the spectra near the V4O7 metal-insulator phase transition.