Fermi level unpinning achievement and transport modification in Hf1-xYbxOy/Al2O3/GaSb laminated stacks by doping engineering

Journal of Materials Science & Technology(2022)

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摘要
•Interface chemistry and transport characteristics determination of Hf1-xYbxOy/Al2O3/GaSb gate stacks have been achieved.•Hf1-xYbxOy/Al2O3/GaSb (x = 0.32) gate stack has demonstrated the optimized interface stability and the suppressed leakage current density of 2.23×10–5 A cm-2.•The energy distribution of interface state has confirmed the achievement of the lowest interface state density of 1.98×1013 eV-1 cm-2, resulting in Fermi level unpinning.
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关键词
Fermi level pinning,High-k gate dielectrics,Field effect transistor,Electrical transport mechanism,Doping
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