Path Towards a Vertical TFET Enabled by Atomic Precision Advanced Manufacturing

2021 Silicon Nanoelectronics Workshop (SNW)(2021)

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摘要
We propose a vertical TFET using atomic precision advanced manufacturing (APAM) to create an abrupt buried n ++ -doped source. We developed a gate stack that preserves the APAM source to accumulate holes above it, with a goal of band-to-band tunneling (BTBT) perpendicular to the gate - critical for the proposed device. A metal-insulator-semiconductor (MIS) capacitor shows hole accumulation above the APAM source, corroborated by simulation, demonstrating the TFET's feasibility.
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关键词
vertical TFET,atomic precision advanced manufacturing,gate stack,APAM source,band-to-band tunneling,hole accumulation,BTBT,metal-insulator-semiconductor capacitor,MIS capacitor
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