Comparison of the effectiveness of nonlinear regression algorithms in the process of identifying defect centers in semiinsulating semiconductor materials

Witold Kaczmarek,Marek Suproniuk,Karol Piwowarski,Bogdan Perka,Piotr Paziewski

PRZEGLAD ELEKTROTECHNICZNY（2021）

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摘要

The article presents tests of nonlinear regression algorithms used to identify the parameters of defect centers from simulated photocurrent relaxation signal. The results of the experiment are the basis for the use of non-linear regression algorithms in the process of identifying defect centers.

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关键词

defect centres, semiconductor materials, HRPITS, nonlinear regression method

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