Differences in Printed Contacts Lead to Susceptibility of Silicon Cells to Series Resistance Degradation
IEEE Journal of Photovoltaics(2022)
摘要
In this case study, we investigate a degradation mode occurring at the cell level in fielded multi-Si modules. The modules exhibit a mix of affected and unaffected cells. Affected cells show a progressive, series-resistance-related power degradation as shown via module- and cell-level IV curves, along with electroluminescence (EL) and PL imaging at the module, cell, and cell core sample scales. Sc...
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关键词
Degradation,Imaging,Resistance,Silicon,Silver,Photovoltaic systems,Zinc
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