Tunable tiling selective plane illumination microscopy with 3D Nyquist sampling

Selective plane illumination microscopy (SPIM) is a volumetric fluorescent imaging method based on orthogonal light pathways for excitation and detection. A common approach to rapidly image large samples is to reduce the spatial sampling rate below the Nyquist limit to acquire a large field of view (FOV). One consequence of extending the lateral FOV is a loss of axial resolution as the excitation light sheet properties are tuned to match the FOV. It is possible to maintain high axial resolution across large FOVs by translating the excitation light sheet through a static sample.