Direct Measurement for Nanoscale Vertical Carrier Diffusion on Semiconductor Surface—an Approach Toward Scanning Diffusion MicroscopyYakun Wang,Zhenghui Liu,Wentao Song,Gengzhao Xu,Kebei Chen,Chunyu Zhang,Sha Han,Jianfeng Wang,Ke XuJournal of Applied Physics（2022）引用 2|浏览4AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
