Impact of Dynamic Voltage Scaling on SEU Sensitivity of COTS Bulk SRAMs and A-LPSRAMs Against Proton Radiation
IEEE Transactions on Nuclear Science（2022）
Key words
Voltage control,Protons,Sensitivity,Radiation effects,Single event upsets,Neutrons,Microcontrollers,Commercial-off-the-shelf (COTS),multiscales single-event phenomena predictive platform (MUSCA-SEP3),proton tests,radiation hardness,reliability,soft error,static random access memory (SRAM)
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