A Novel Voltage Divider Trigger SCR With Low Leakage Current for Low-Voltage ESD Application

Jizhi Liu, Yilin Liu,Aoran Han,Yanlin Nie,Qiupei Huang,Zhiwei Liu

IEEE Transactions on Electron Devices（2022）

Cited 5|Views0

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Abstract

In this article, a novel voltage divider trigger silicon-controlled rectifier (VDTSCR) with low trigger voltage and low leakage current for electrostatic discharge (ESD) protection applications has been proposed and verified in a 65-nm epitaxial CMOS process. The trigger structure formed by a voltage divider and an nMOS is introduced to the proposed structure. The voltage divider composed of two s...

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Key words

Capacitance,MOS devices,Anodes,Junctions,Leakage currents,Breakdown voltage,Logic gates

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