A 20.5-nW Resistor-Less Bandgap Voltage Reference With Self-Biased Compensation for Process Variations
IEEE Transactions on Very Large Scale Integration (VLSI) Systems(2022)
摘要
This brief proposes a resistor-less bandgap reference (BGR) based on a leakage-based proportional-to-absolute-temperature (PTAT) scheme. The effect of process variations on the current is mitigated by employing self-biased current-limiting MOS transistors. The bias voltages needed for approximating a large resistance can be obtained from a single branch by placing threshold-sampling transistors on top of the BGR output. The fabricated BGR in 0.18-
$\mu \text{m}$
CMOS occupies an active area of 0.035 mm
2
and consumes 20.5 nW, and it shows a standard deviation of 0.68% at untrimmed reference voltages.
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关键词
Bandgap reference (BGR),process compensation,sensor application,ultralow-power (ULP),voltage reference
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