On the Origin of the Turn-on Voltage Drop of GaN-based Current Aperture Vertical Electron TransistorsPhilipp Doering,Matthias Sinnwell,Richard Reiner,Rachid Driad,Patrick Waltereit,Stefano Leone,Stefan Mueller,Michael Mikulla,Oliver AmbacherJournal of Applied Physics（2022）引用 4|浏览3AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
