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Non-destructive Imaging of Residual Strains in GaN and Their Effect on Optical and Electrical Properties Using Correlative Light–electron Microscopy

G. Naresh-Kumar,P. R. Edwards,T. Batten, M. Nouf-Allehiani, A. Vilalta-Clemente, A. J. Wilkinson,E. Le Boulbar,P. A. Shields, B. Starosta,B. Hourahine,R. W. Martin,C. Trager-Cowan

Journal of Applied Physics(2022)

Cited 3|Views5
Key words
Environmental Scanning Electron Microscopy,Scanning Electron Microscopy,Nanomaterials Characterization
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