Proton Direct Ionization in Sub-Micron Technologies: Numerical Method for RPP Parameter Extraction
IEEE Transactions on Nuclear Science（2022）
Key words
Protons,Geometry,Numerical models,Projectiles,Data models,Single event upsets,Silicon,Linear energy transfer (LET),Monte Carlo (MC) method,proton direct ionization (PDI),rectangular parallelepiped (RPP),single-event upset (SEU),straggling
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